DocumentCode :
2855619
Title :
Dynamically pulsed MTCMOS with bus encoding for total power and crosstalk minimization
Author :
Deogun, Harmander Singh ; Rao, Rahul ; Sylvester, Dennis ; Brown, Richard ; Nowka, Kevin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
2005
fDate :
21-23 March 2005
Firstpage :
88
Lastpage :
93
Abstract :
Increased buffer insertion along on-chip global lines and the increasing contribution of leakage power have resulted in buffer leakage emerging as one of the chief contributors to system leakage power. We present a novel power-gating scheme for repeaters on global bus lines that address the pressing problem of runtime leakage while simultaneously eliminating worst-case capacitive coupling between adjacent bus lines. We propose using a pulsed MTCMOS (multiple threshold CMOS) scheme that dynamically activates the bus system only when transmitting a signal. Additionally, a bus encoding scheme is used to eliminate worst-case coupling and thereby negate the power-gating and pulse generation performance penalty. We consider all sources of delay and leakage power, including that of the MTCMOS control circuitry. This technique can result in nearly a 30% reduction in total bus system power for low switching activities and up to 2.3 times reduction in standby mode leakage with no reactivation delay penalty.
Keywords :
CMOS digital integrated circuits; buffer circuits; crosstalk; encoding; minimisation; power consumption; system buses; buffer insertion; buffer leakage; bus encoding; bus encoding scheme; capacitive coupling; crosstalk minimization; dynamically pulsed MTCMOS; multiple threshold CMOS; on-chip global bus lines; power minimization; power-gating scheme; pulsed multi-threshold CMOS; repeaters; system leakage power; Coupling circuits; Crosstalk; Delay; Encoding; Minimization; Pressing; Pulse generation; Repeaters; Runtime; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
Type :
conf
DOI :
10.1109/ISQED.2005.49
Filename :
1410563
Link To Document :
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