• DocumentCode
    2855728
  • Title

    Elastic registration of MRI scans using fast DCT

  • Author

    Eric, Touraille ; Jean-Yves, Boire

  • Author_Institution
    Fac. de Med., ERIM, France
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2854
  • Abstract
    Analysis and comparison of functional SPECT brain scans from different subjects require a common space of study. For this purpose, an elastic matching between a MRI of reference and the MRI of the patient can be performed. A variant of a voxel-based method initially created in SPM software was implemented. A deformation map is defined as a linear combination of basis functions of the discrete cosine transform. The coefficients of this combination are the parameters of the transformation. They are optimized to minimize a cost function which represents the distance between the reference and the deformed volume. A multi-parameters and multi-resolutions scheme, combined with a conjugate gradient method, completes the optimization. A fast discrete cosine transform is used for efficient computations of the cost function and its gradient. This algorithm has been tested with 5 MRI volumes of 1283 voxels, elastically matched on a sixth MRI volume and the results show improvement upon simple nine parameters registration
  • Keywords
    biomedical MRI; brain; conjugate gradient methods; discrete cosine transforms; image matching; image registration; medical image processing; MRI scans; basis functions; conjugate gradient method; cost function; deformation map; elastic matching; elastic registration; fast DCT; linear combination; multiparameters scheme; multiresolutions scheme; nine parameters registration; voxel-based method; Alzheimer´s disease; Cost function; Discrete cosine transforms; Gradient methods; Image resolution; Magnetic resonance imaging; Optimization methods; Pathology; Scanning probe microscopy; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-6465-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.2000.901463
  • Filename
    901463