Title :
Waveform relaxation for transient simulation of two-dimensional MOS devices
Author :
Reichelt, M. ; White, J. ; Allen, J.
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
Abstract :
The authors present experimental results demonstrating the effectiveness of waveform relaxation (WR) for solving the large, sparsely connected algebraic and differential system generated by standard spatial discretization of the two-dimensional time-dependent semiconductor device equation. The experiments demonstrate that WR converges in a uniform manner, and that there is typically some multirate behavior in a device that the WR algorithm can exploit. Speed and accuracy comparisons are made between standard direct methods, red/black Gauss-Seidel WR, and red/black overrelaxed WR. For their experiments, calculated terminal currents matched well between the methods, and overrelaxed WR was up to a factor of 3 faster than direct methods.<>
Keywords :
convergence of numerical methods; digital simulation; iterative methods; relaxation theory; semiconductor device models; accuracy; algebraic systems; multirate behavior; red/black Gauss-Seidel WR; red/black overrelaxed WR; sparsely connected algebraic; sparsely connected differential systems; spatial discretization; transient simulation; two-dimensional MOS devices; two-dimensional time-dependent semiconductor device equation; waveform relaxation; Charge carrier processes; Circuit simulation; Computational modeling; Concurrent computing; Current density; Differential algebraic equations; Jacobian matrices; MOS devices; Poisson equations; Semiconductor devices;
Conference_Titel :
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-1986-4
DOI :
10.1109/ICCAD.1989.76981