• DocumentCode
    2855814
  • Title

    An efficient channel routing algorithm for defective arrays

  • Author

    Youn, H.Y. ; Singh, A.D.

  • Author_Institution
    Dept. of Comput. Sci., North Texas Univ., Denton, TX, USA
  • fYear
    1989
  • fDate
    5-9 Nov. 1989
  • Firstpage
    432
  • Lastpage
    435
  • Abstract
    Although a number of defect-tolerance schemes for two-dimensional VLSI/WSI (wafer scale integration) processor arrays have been proposed in the literature, none is efficient enough always to guarantee a restructured array that utilizes all the good processors on the wafer while using only a limited number of interconnection channels. The authors present a restructuring scheme that can achieve this (no matter how severely clustered the faults) with a maximum channel width of three, provided the total number of faults in the array are within some stated limits. For practical size arrays, this limit is large enough so as not be be restrictive in practice. Moreover, the scheme also works extremely well, in a probabilistic sense, for a larger number of faults, when the failed processors are severely clustered.<>
  • Keywords
    cellular arrays; fault tolerant computing; parallel architectures; VLSI; WSI; channel routing algorithm; defect-tolerance schemes; defective arrays; interconnection channels; maximum channel width; probabilistic; processor arrays; restructured array; two-dimensional; wafer scale integration; Circuit faults; Clustering algorithms; Delay; Displays; Fault tolerance; Integrated circuit interconnections; Logic arrays; Routing; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-1986-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.1989.76985
  • Filename
    76985