DocumentCode
2855814
Title
An efficient channel routing algorithm for defective arrays
Author
Youn, H.Y. ; Singh, A.D.
Author_Institution
Dept. of Comput. Sci., North Texas Univ., Denton, TX, USA
fYear
1989
fDate
5-9 Nov. 1989
Firstpage
432
Lastpage
435
Abstract
Although a number of defect-tolerance schemes for two-dimensional VLSI/WSI (wafer scale integration) processor arrays have been proposed in the literature, none is efficient enough always to guarantee a restructured array that utilizes all the good processors on the wafer while using only a limited number of interconnection channels. The authors present a restructuring scheme that can achieve this (no matter how severely clustered the faults) with a maximum channel width of three, provided the total number of faults in the array are within some stated limits. For practical size arrays, this limit is large enough so as not be be restrictive in practice. Moreover, the scheme also works extremely well, in a probabilistic sense, for a larger number of faults, when the failed processors are severely clustered.<>
Keywords
cellular arrays; fault tolerant computing; parallel architectures; VLSI; WSI; channel routing algorithm; defect-tolerance schemes; defective arrays; interconnection channels; maximum channel width; probabilistic; processor arrays; restructured array; two-dimensional; wafer scale integration; Circuit faults; Clustering algorithms; Delay; Displays; Fault tolerance; Integrated circuit interconnections; Logic arrays; Routing; Silicon; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-1986-4
Type
conf
DOI
10.1109/ICCAD.1989.76985
Filename
76985
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