• DocumentCode
    2855924
  • Title

    Applying K-means clustering and technology map in Asia Pacific-semiconductors industry analysis

  • Author

    Fan, Chin Yuan ; Lai, M.F. ; Huang, T.Y. ; Huang, C.M.

  • Author_Institution
    Sci. & Technol. Policy Res. & Inf. Center, Nat. Appl. Res. Labs., Taipei, Taiwan
  • fYear
    2011
  • fDate
    6-9 Dec. 2011
  • Firstpage
    1043
  • Lastpage
    1047
  • Abstract
    In recent years, the semiconductor market has gradually moved away from advanced countries and relocated to the Asia-Pacific region. Since the 1980s Taiwan has also been developing its own semiconductor industry, and, after twenty years of efforts, has become one of the world´s major exporters of semiconductor products. Therefore, in order to position Taiwan in relation to other countries in terms of competitive advantage as defined by technology and industrial development, we need to better understand developmental trends of semiconductor technology of major competing countries in the Asia-Pacific region. By doing this we can further provide our government with additional strategic development proposals. In this study, we used a combination of patents, data mining methods (multidimensional scaling (MDS) analysis, and K-means clustering) to explore competing technological and strategic group relationships within the semiconductor industry in the Asia-Pacific region. We assessed the relative technological advantages of various organizations and proposed additional technology development strategy recommendations to Taiwan´s semiconductor industry.
  • Keywords
    data analysis; data mining; manufacturing data processing; patents; pattern clustering; research and development; semiconductor industry; Asia Pacific; K-means clustering; Taiwan; data mining method; industrial development; multidimensional scaling analysis; patent; semiconductor industry analysis; semiconductor product; technology development; technology map; Assembly; Electronics industry; Manufacturing processes; Materials; Patents; Semiconductor industry; analysis of patent technology; k-means clustering; multidimensional scaling (MDS);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
  • Conference_Location
    Singapore
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4577-0740-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2011.6118074
  • Filename
    6118074