DocumentCode
2855924
Title
Applying K-means clustering and technology map in Asia Pacific-semiconductors industry analysis
Author
Fan, Chin Yuan ; Lai, M.F. ; Huang, T.Y. ; Huang, C.M.
Author_Institution
Sci. & Technol. Policy Res. & Inf. Center, Nat. Appl. Res. Labs., Taipei, Taiwan
fYear
2011
fDate
6-9 Dec. 2011
Firstpage
1043
Lastpage
1047
Abstract
In recent years, the semiconductor market has gradually moved away from advanced countries and relocated to the Asia-Pacific region. Since the 1980s Taiwan has also been developing its own semiconductor industry, and, after twenty years of efforts, has become one of the world´s major exporters of semiconductor products. Therefore, in order to position Taiwan in relation to other countries in terms of competitive advantage as defined by technology and industrial development, we need to better understand developmental trends of semiconductor technology of major competing countries in the Asia-Pacific region. By doing this we can further provide our government with additional strategic development proposals. In this study, we used a combination of patents, data mining methods (multidimensional scaling (MDS) analysis, and K-means clustering) to explore competing technological and strategic group relationships within the semiconductor industry in the Asia-Pacific region. We assessed the relative technological advantages of various organizations and proposed additional technology development strategy recommendations to Taiwan´s semiconductor industry.
Keywords
data analysis; data mining; manufacturing data processing; patents; pattern clustering; research and development; semiconductor industry; Asia Pacific; K-means clustering; Taiwan; data mining method; industrial development; multidimensional scaling analysis; patent; semiconductor industry analysis; semiconductor product; technology development; technology map; Assembly; Electronics industry; Manufacturing processes; Materials; Patents; Semiconductor industry; analysis of patent technology; k-means clustering; multidimensional scaling (MDS);
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
Conference_Location
Singapore
ISSN
2157-3611
Print_ISBN
978-1-4577-0740-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2011.6118074
Filename
6118074
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