DocumentCode :
2856061
Title :
Dosimetric evaluation of UMW electron wedges
Author :
Wu, Xiaodong ; Chen, Zong-Ping ; Luo, Chunsong ; Watzich, Marcia L. ; Larsen, Ronald ; Shao, Hua ; Wolfson, Aaron H. ; Markoe, Arnold M.
Author_Institution :
Dept. of Radiat. Oncology, Miami Univ., FL, USA
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
2924
Abstract :
A dosimetric evaluation was performed for a set of UMW electron wedges, developed at the University of Miami and manufactured by MED-TEC, Inc., on a Varian CL-2100 CD accelerator. These electron wedges were designed to generate wedged electron beam profiles with virtually no degradation of beam energy. For electron beams ranging from 6 to 18 MeV, depth doses and beam profiles were acquired at various depths including the photon contamination region using a Wellhofer water tank with a 0.14 cc ion chamber. The analysis showed that the changes in beam energy in the wedge filtering process were insignificant (on the order of 0.1 MeV). A maximum of 1.5% increase in X-ray dose was found. Based on the fact that the wedge effect does not introduce significant energy variations across the wedged direction, the Hogstrom electron pencil beam algorithm was used for dose computation with the electron fluence tuned in both wedged and un-wedged directions using scanned profiles at the depth of 0.5 R90. Examples of improved dose distribution in oblique beam setup applying these electron wedges are demonstrated. The results show the abilities of these UMW electron wedges in achieving better dose distributions when curved surfaces, oblique beam entries and variable target depths are encountered in electron beam radiotherapy
Keywords :
dosimetry; electron beam applications; radiation therapy; 0.1 MeV; 6 to 18 MeV; Hogstrom electron pencil beam algorithm; UMW electron wedges; dose computation; dosimetric evaluation; electron beam therapy; electron fluence; improved dose distribution; oblique beam setup; radiotherapy dosimetry; scanned profiles; unwedged directions; variable target depths; wedge filtering process; Contamination; Degradation; Electromagnetic scattering; Electron accelerators; Electron beams; Manufacturing; Particle scattering; Performance evaluation; Surface treatment; Water pollution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1094-687X
Print_ISBN :
0-7803-6465-1
Type :
conf
DOI :
10.1109/IEMBS.2000.901488
Filename :
901488
Link To Document :
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