Title :
N versus P channel for single-supply TTL compatibility
Author :
Seeds, R. ; Badertscher, R.
Author_Institution :
Fairchild Semiconductor, Mountai View, CA, USA
Abstract :
The application of N and P-channel processes to 5-V circuits with TTL inout/output compatibility will be discussed. Silicon-gate isoplanar processing with depletion-load devices will be covered.
Keywords :
Control systems; Doping; Implants; Impurities; Inverters; Large scale integration; Oxidation; Solid state circuit design; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155225
