Resonator probe for near-field scanning microwave microscope

Author

Gordienko, Yu.Ye. ; Ryabukhin, A.A. ; Slipchenko, N.I. ; Ananyin, V.V.

Author_Institution

Kharkov Nat. Univ. of Radioelectron.

Volume

2

fYear

2005

fDate

16-16 Sept. 2005

Firstpage

721

Abstract

Resonator probe, operating at 35.7 GHz and based on the connected cavity and coaxial resonators, has been developed. Sample insertion in a field of the probe results in simultaneous change of resonance frequency and Q-factor of the resonator that allows to determine characteristics of the sample analyzed. On the basis of described resonator probe the model prototype of a near-field scanning microwave microscope for local contactless micro-diagnostics of physicomechanical, electric and photo-electric properties of substances, including semiconductors, dielectric materials, conductors and superconducting materials, and also sandwich structures on their basis has been created

Keywords

Q-factor; dielectric materials; scanning probe microscopy; superconducting cavity resonators; 35.7 GHz; Q-factor; cavity resonator; coaxial resonator; dielectric material; near-field scanning microwave microscope; photo-electric property; physicomechanical property; resonator probe; superconducting material; Coaxial components; Conducting materials; Dielectric materials; Microscopy; Probes; Prototypes; Q factor; Resonance; Resonant frequency; Superconducting materials;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave & Telecommunication Technology, 2005 15th International Crimean Conference

Conference_Location

Sevastopol, Crimea

Print_ISBN

966-7968-80-4

Type

conf

DOI

10.1109/CRMICO.2005.1565108

Filename

1565108