Title :
Measure of non-standard systems of Z- and S-parameters for microwave two-ports
Author :
Filinyuk, N.A. ; Ogorodnik, K.V. ; Saleh, M.M.J.
Author_Institution :
Vinnitsa Nat. Tech. Univ.
Abstract :
Measuring method of non-standard systems of Z- and S-parameters for microwave two-ports by measuring of complex reflection coefficients from input (output) of two-port with arbitrary loads is considered
Keywords :
S-parameters; microwave devices; microwave measurement; two-port networks; S-parameters; Z- parameters; complex reflection coefficient; microwave two-port network; nonstandard system; Helium; IEEE catalog; Microwave measurements; Microwave technology; Organizing; Scattering parameters;
Conference_Titel :
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-80-4
DOI :
10.1109/CRMICO.2005.1565116
