Title :
A 25-Ns read access bipolar 1k/bit-TTL RAM
Author :
Mayumi, H. ; Nokubo, J. ; Okada, Kenichi
Author_Institution :
Nippon Electric Co., Ltd., Kanagawa, Japan
Keywords :
Electron devices; Integrated circuit interconnections; Logic circuits; Logic devices; Meeting planning; Resistors; Shape;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155235
