Analysis on the reliability of IED and GOOSE network in 500kV substation based on IEC61850 standard

Author

Yang, Song ; Diqiu, Shen ; Ming, Li ; Jimeng, Pan ; Yan, Tan

Author_Institution

China Southern Grid Extra High Voltage, Transm. Co. Liuzhou Bur., Liuzhou, China

Volume

12

fYear

2010

fDate

22-24 Oct. 2010

Abstract

The IEC61850 standard is the next generation of power substation. The reliability of IEC61850 substation more and more depends on new Intelligence Electronic Device (IED) and General Object Oriented Substation Event (GOOSE) network. As the highest voltage level IEC 61850 substation in China, all of IED and GOOSE network in 500kV Guilin substation were carefully tested, dynamic simulated and put into practice. The paper introduced general situation about 500kV Guilin IEC 61850 substation. After that, the paper summarized problems about this new generation technology appeared in simulation and factual operation. Finally the paper concluded the IEC61850 devices and network is reliable in 500kV substation.

Keywords

IEC standards; power engineering computing; power system reliability; substation automation; substation protection; GOOSE network; IEC 61850 standard; IED reliability; general object oriented substation event network; intelligence electronic device; power substation; voltage 500 kV; Computer network reliability; IEC standards; Power system dynamics; Power system reliability; Reliability; Substations; GOOSE; IEC 61850 standard; IED; substation reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Application and System Modeling (ICCASM), 2010 International Conference on

Conference_Location

Taiyuan

Print_ISBN

978-1-4244-7235-2

Electronic_ISBN

978-1-4244-7237-6

Type

conf

DOI

10.1109/ICCASM.2010.5622132

Filename

5622132