Title :
Analysis of S-parameters modules sensitivity of waveguide measurement cell for low loss dielectric case
Author :
Manoylov, V.P. ; Chukhov, V.V.
Author_Institution :
Zhytomyr State Technol. Univ.
Abstract :
Considered in this paper are sensitivity coefficients for modules of S-parameters of waveguide measuring cell depending on thickness of dielectric layer, its permeability and wavelength in the case of low loss dielectric. Some recommendations regarding the choice of optimal measurement frequency are given
Keywords :
S-parameters; dielectric waveguides; permeability; sensitivity analysis; S-parameter module sensitivity; dielectric layer; permeability; waveguide measuring cell; Computer aided software engineering; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Helium; Loss measurement; Microwave technology; Organizing; Scattering parameters; Strontium;
Conference_Titel :
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-80-4
DOI :
10.1109/CRMICO.2005.1565118
