DocumentCode
2856248
Title
Analysis of S-parameters modules sensitivity of waveguide measurement cell for low loss dielectric case
Author
Manoylov, V.P. ; Chukhov, V.V.
Author_Institution
Zhytomyr State Technol. Univ.
Volume
2
fYear
2005
fDate
16-16 Sept. 2005
Firstpage
743
Abstract
Considered in this paper are sensitivity coefficients for modules of S-parameters of waveguide measuring cell depending on thickness of dielectric layer, its permeability and wavelength in the case of low loss dielectric. Some recommendations regarding the choice of optimal measurement frequency are given
Keywords
S-parameters; dielectric waveguides; permeability; sensitivity analysis; S-parameter module sensitivity; dielectric layer; permeability; waveguide measuring cell; Computer aided software engineering; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Helium; Loss measurement; Microwave technology; Organizing; Scattering parameters; Strontium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-80-4
Type
conf
DOI
10.1109/CRMICO.2005.1565118
Filename
1565118
Link To Document