Title :
Transmission Line frequency Impedance Characteristic and It´s Influence in Transient Protection
Author :
Li, Lei ; Xiangjun, Zeng ; Jianhua, Liu ; Zhengyi, Liu ; Qian, Lv ; Xiaoli, Zhang
Author_Institution :
Coll. of Electr. & Inf. Eng., Changsha Univ. of Sci. & Technol.
Abstract :
The transient protection with fault generated high frequency transient signals is a developmental direction of modern power system. It has the advantages: quick fault detection, high precision, no influence by the foundation frequency signal, current transformer saturation and fault resistance. Whereas, the protection is still not applied widely in power systems because the theories about the high frequency transient signal transmission and declining are not very clear. In order to improve it, the frequency impedance characteristics of transmission line are analyzed in the paper. And their effects in the transient protection, especially in traveling wave based fault location are presented. Wavelet packet analysis is then introduced to decompose the fault produced transient signals and remove disturbances, and the wavelet packed analysis based transient protection is simulated. The precision of protection and fault location can be improved
Keywords :
electric impedance; fault location; power system protection; power system transients; power transmission faults; power transmission lines; transient analysis; wavelet transforms; fault detection; fault location; frequency impedance characteristic; high frequency transient signals; power system protection; transient protection; transmission line frequency impedance; wavelet packet analysis; Fault location; Frequency; Impedance; Power system faults; Power system protection; Power system transients; Power transmission lines; Transient analysis; Transmission line theory; Transmission lines; Frequency impedance characteristic; fault location; transient protection; transient signal; transmission line;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256786