• DocumentCode
    2856315
  • Title

    Pattern Verification-Based Increment Memory Testing Method for Safety-Critical System

  • Author

    Deng, Zhi-Yao ; Sang, Nan

  • Author_Institution
    Dept. of Software Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
  • fYear
    2008
  • fDate
    29-31 July 2008
  • Firstpage
    120
  • Lastpage
    125
  • Abstract
    Safety-critical system (SCS) has highly demand for the dependability, which requires plenty of resource to ensure the system under test (SUT) satisfy the dependability requirement. Nowadays few of testing approach can efficiently cover the dependability of SUT. This paper proposes a new SCS testing method to improve SCS adaptive dependability testing, which integrates two strategies: the verification pattern and the incremental memory model. This new method generates the test cases by the verification pattern definition and makes evaluating calculation by setting memory unit to record the failure events. Then the least quantity of scenario test case for next test execution will be calculated according to the promised SUTpsilas confidence level. In this way, the feedback data is generated to weight controller as the guideline for the further testing. Finally, a comprehensive experiment study demonstrates that this adaptive testing method can really work in practice. This rapid testing method, pattern and testing statistics-based adaptive control, makes the SCS dependability testing much more effective.
  • Keywords
    adaptive control; program testing; program verification; software reliability; statistical analysis; storage management; dependability testing; increment memory testing method; pattern verification; safety-critical system; statistics-based adaptive control; system under test; Automatic testing; Conferences; Electronic equipment testing; Embedded software; Feedback; Power system reliability; Safety; Software engineering; Software testing; System testing; adaptive; feedback; safety-critical system; scenario pattern; testing; verification pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Software and Systems Symposia, 2008. ICESS Symposia '08. International Conference on
  • Conference_Location
    Sichuan
  • Print_ISBN
    978-0-7695-3288-2
  • Type

    conf

  • DOI
    10.1109/ICESS.Symposia.2008.97
  • Filename
    4627143