Title :
Diagnostics of dielectric parameters of two-layer structures by means of open resonators in the millimeter wave-band
Author :
Fonin, D.G. ; Kanunov, E.R.
Author_Institution :
Fac. of Phys., Moscow State Univ.
Abstract :
The principles of measurement of UHF parameters of two-layer structures: the dielectric permittivity (epsiv) and the loss tangent (tgdelta) using open resonators are presented. These principles are based on the measurement of open resonator characteristics-the Q-factor and the resonance frequency-when putting the sample under investigation into the resonance volume
Keywords :
Q-factor; UHF measurement; dielectric losses; dielectric resonators; millimetre wave measurement; permittivity; Q-factor; UHF parameter; dielectric parameter diagnostics; dielectric permittivity; loss tangent; millimeter wave-band; open resonator measurement; resonance frequency; two-layer structures; ultrahigh frequency; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Loss measurement; Millimeter wave measurements; Permittivity measurement; Resonance; UHF measurements; Volume measurement;
Conference_Titel :
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-80-4
DOI :
10.1109/CRMICO.2005.1565136
