Title :
The ADT evaluation method based on MCMC
Author :
Wang, Lizhi ; Li, Xiaoyang ; Jiang, Tongmin ; Zhuang, Xiaotian
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.
Keywords :
Markov processes; Monte Carlo methods; diodes; life testing; maximum likelihood estimation; reliability; ADT accelerated model; ADT evaluation method; MCMC method; Markov Chain Monte Carlo method; SLD; accelerated degradation testing; degradation model; engineering application; maximum likelihood estimation method; reliability model; super luminescent diode; Acceleration; Data models; Degradation; Reliability; Stress; Superluminescent diodes; Accelerated degradation testing; Markov Chain Monte Carlo; reliability; super luminescent diode;
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-0740-7
Electronic_ISBN :
2157-3611
DOI :
10.1109/IEEM.2011.6118116
