The ADT evaluation method based on MCMC

Author

Wang, Lizhi ; Li, Xiaoyang ; Jiang, Tongmin ; Zhuang, Xiaotian

Author_Institution

Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China

fYear

2011

fDate

6-9 Dec. 2011

Firstpage

1251

Lastpage

1255

Abstract

This paper proposes an accelerated degradation testing (ADT) evaluation method based on Markov Chain Monte Carlo (MCMC) method. Firstly the degradation model, reliability model and accelerated model of ADT are introduced; secondly, with the information above, the ADT evaluation method based on MCMC is proposed; Thirdly, the evaluation results of this method would be studied and compared with the evaluation results of the maximum likelihood estimation method by two simulation examples. Finally, the method proposed is taken to evaluate the lifetime and reliability of super luminescent diode (SLD) as an engineering application.

Keywords

Markov processes; Monte Carlo methods; diodes; life testing; maximum likelihood estimation; reliability; ADT accelerated model; ADT evaluation method; MCMC method; Markov Chain Monte Carlo method; SLD; accelerated degradation testing; degradation model; engineering application; maximum likelihood estimation method; reliability model; super luminescent diode; Acceleration; Data models; Degradation; Reliability; Stress; Superluminescent diodes; Accelerated degradation testing; Markov Chain Monte Carlo; reliability; super luminescent diode;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on

Conference_Location

Singapore

ISSN

2157-3611

Print_ISBN

978-1-4577-0740-7

Electronic_ISBN

2157-3611

Type

conf

DOI

10.1109/IEEM.2011.6118116

Filename

6118116