DocumentCode :
2856610
Title :
Statistical analysis of clock skew variation in H-tree structure
Author :
Hashimoto, Masanori ; Yamamoto, Tomonori ; Onodera, Hidetoshi
Author_Institution :
Dept. of Commun. & Comput. Eng., Kyoto Univ., Japan
fYear :
2005
fDate :
21-23 March 2005
Firstpage :
402
Lastpage :
407
Abstract :
This paper discusses clock skew due to manufacturing variability and environmental change. In clock tree design, transition time constraint is an important design parameter that controls clock skew and power dissipation. In this paper we evaluate clock skew under several variability models, and demonstrate relationship among clock skew, transition time constraint and power dissipation. Experimental results show that constraint of small transition time reduces clock skew under manufacturing and supply voltage variabilities, whereas there is an optimum constraint value for temperature gradient. Our experiments in a 0.18 μm technology indicate that clock skew is minimized when clock buffer is sized such that the ratio of output and input capacitance is four.
Keywords :
VLSI; buffer circuits; capacitance; integrated circuit design; logic design; power consumption; sequential circuits; statistical analysis; timing circuits; 0.18 micron; H-tree structure; clock buffer; clock skew variation; clock tree design; environmental change; manufacturing variability; output input capacitance ratio; power dissipation; statistical analysis; supply voltage variabilities; temperature gradient; transition time constraint; Capacitance; Clocks; Manufacturing; Power dissipation; Statistical analysis; Temperature; Time factors; Uncertainty; Voltage; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
Type :
conf
DOI :
10.1109/ISQED.2005.114
Filename :
1410616
Link To Document :
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