• DocumentCode
    2856612
  • Title

    Impact of Maximum Back-EMF Limits on the Performance Characteristics of Interior Permanent Magnet Synchronous Machines

  • Author

    Han, Seok-Hee ; Jahns, Thomas M. ; Aydin, Metin ; Guven, Mustafa K. ; Soong, Wen L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
  • Volume
    4
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    1962
  • Lastpage
    1969
  • Abstract
    Interior permanent magnet (IPM) synchronous machines are vulnerable to uncontrolled generator (UCG) faults at high speed that can damage the inverter. One approach to reducing this risk is to impose limits on the maximum machine back-EMF voltage at top speed. This paper presents the results of a comparative design study that clarifies the nature and extent of the penalties imposed on the IPM machine metrics and performance characteristics as a result of imposing progressively tighter values of back-EMF voltage limits. As an alternative to limiting back-EMF and penalizing machine designs, this paper also investigates the effectiveness of the system-side protection approach to the same UCG fault problem
  • Keywords
    electric potential; overvoltage protection; permanent magnet generators; power system faults; power system protection; synchronous generators; IPM machine metrics; IPM synchronous machines; UCG faults; back-EMF voltage limits; interior permanent magnet synchronous machines; maximum back-EMF limits; performance characteristics; system-side protection approach; uncontrolled generator faults; Circuit faults; Inverters; Permanent magnet machines; Permanent magnets; Power generation; Scanning probe microscopy; Surge protection; Synchronous generators; Synchronous machines; Voltage; IPM; UCG; back-emf limit; interior permanent magnet synchronous machine; uncontrolled generator faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256804
  • Filename
    4025492