DocumentCode
2856654
Title
Automated transistor characterization and parameter generation for linear IC design
Author
Ruch, J. ; Hin-Chu Poon ; McCalla, W. ; Scharfetter, D.
Author_Institution
Bell Laboratories, Murray Hill, NJ, USA
Volume
XVII
fYear
1974
fDate
15-13 Feb. 1974
Firstpage
44
Lastpage
45
Abstract
An integrated CAD facility for process-oriented circuit design will be described. Process, device and circuit simulators, which include multidimensional and high-level effects, comprise the facility, presently specialized for linear IC design.
Keywords
Bipolar transistors; Character generation; Circuit simulation; Circuit synthesis; Computational modeling; Costs; Integrated circuit modeling; Predictive models; Semiconductor device modeling; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1974.1155263
Filename
1155263
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