Title :
Automated transistor characterization and parameter generation for linear IC design
Author :
Ruch, J. ; Hin-Chu Poon ; McCalla, W. ; Scharfetter, D.
Author_Institution :
Bell Laboratories, Murray Hill, NJ, USA
Abstract :
An integrated CAD facility for process-oriented circuit design will be described. Process, device and circuit simulators, which include multidimensional and high-level effects, comprise the facility, presently specialized for linear IC design.
Keywords :
Bipolar transistors; Character generation; Circuit simulation; Circuit synthesis; Computational modeling; Costs; Integrated circuit modeling; Predictive models; Semiconductor device modeling; Spontaneous emission;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155263
