Title :
Control chart for monitoring dependent binomial processes
Author :
Kuo, Tsen-I ; Lin, Cheng-Shih ; Chen, Tung-Tsan ; Hung, Hsin-Hua
Author_Institution :
Dept. of Bus. Adm., Nat. Quemoy Univ., Kinmen, Taiwan
Abstract :
Many processes data are autocorrelated, and traditional methods may lead to false results. Hence, traditional methods are not appropriate. Attribute control charts for monitoring dependent processes are lacking. Hence, we will investigate attribute control charts for monitoring dependent binomial processes in this study. We evaluate the performance of attribution control charts for monitoring dependent processes by average run length.
Keywords :
control charts; polynomials; process monitoring; attribute control charts; dependent binomial processes; monitoring; Control charts; Correlation; Industries; Markov processes; Monitoring; Process control; Quality control; Statistical process control; attribute control chart; average run length; correlation binomial model;
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-0740-7
Electronic_ISBN :
2157-3611
DOI :
10.1109/IEEM.2011.6118133
