DocumentCode
2856880
Title
Determining economic manufacturing quantity, the optimum process parameters based on Taguchi quadratic quality loss function under rectifying inspection plan
Author
Raj, Ismail Al-Me ; Cinar, Yahya ; Duffuaa, S.O.
Author_Institution
Dept. of Syst. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
fYear
2011
fDate
6-9 Dec. 2011
Firstpage
1348
Lastpage
1353
Abstract
The problem of determining the optimal economic manufacturing quantity and the optimal process parameters is an important problem in production and quality control. This problem has been addressed by Chen and Lai using profit maximization as a criterion to obtain the optimal manufacturing quantity and the mean of the process. In this paper Chen and Lai has been extended to determine the optimal manufacturing quantity, the mean and the variance of the process and the specification limits using rectifying inspection. The simulated annealing approach has been applied to obtain the optimal solution. The utility of the model is demonstrated via a realistic example. The model developed can be utilized to determine the optimal economic manufacturing quantity and process target simultaneously and is expected to provide more insights in managing this important problem.
Keywords
Taguchi methods; industrial economics; inspection; production planning; profitability; simulated annealing; Taguchi quadratic quality loss function; optimal economic manufacturing quantity; optimal manufacturing quantity; optimal process parameters; optimum process parameters; production; profit maximization; quality control; rectifying inspection plan; simulated annealing approach; specification limits; Economics; Inspection; Manufacturing; Mathematical model; Process control; Production; Simulated annealing; Economic manufacturing quantity; Process variance; asymmetric quadratic quality loss function; rectifying inspection plan; simulated annealing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
Conference_Location
Singapore
ISSN
2157-3611
Print_ISBN
978-1-4577-0740-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2011.6118136
Filename
6118136
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