Title :
On a remarkable measurement property of resistive networks
Author :
Subak-Sharpe, G.E.
Author_Institution :
Dept. of Electr. Eng., City Coll., New York, NY, USA
Abstract :
The metric structural viewpoint, which has recently been criticized, is briefly reexamined and found to be valid and unique. This point of view leads to the conclusion that the values of all conductances connected across node pairs in a resistive network can be ascertained by merely measuring the open-circuit resistances across each connected conductance. The measurement of open-circuit resistances across node pairs from which conductances have been removed is not needed for the computation
Keywords :
circuit analysis computing; linear network analysis; lumped parameter networks; measurement of open-circuit resistances; measurement property; metric structural viewpoint; node pairs; open-circuit resistances; resistive networks; Acoustical engineering; Admittance; Cities and towns; Constraint theory; Educational institutions; Electrical resistance measurement; Geometry; Kirchhoff´s Law; Network topology; Symmetric matrices;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230416
