• DocumentCode
    285690
  • Title

    On a remarkable measurement property of resistive networks

  • Author

    Subak-Sharpe, G.E.

  • Author_Institution
    Dept. of Electr. Eng., City Coll., New York, NY, USA
  • Volume
    4
  • fYear
    1992
  • fDate
    3-6 May 1992
  • Firstpage
    1751
  • Abstract
    The metric structural viewpoint, which has recently been criticized, is briefly reexamined and found to be valid and unique. This point of view leads to the conclusion that the values of all conductances connected across node pairs in a resistive network can be ascertained by merely measuring the open-circuit resistances across each connected conductance. The measurement of open-circuit resistances across node pairs from which conductances have been removed is not needed for the computation
  • Keywords
    circuit analysis computing; linear network analysis; lumped parameter networks; measurement of open-circuit resistances; measurement property; metric structural viewpoint; node pairs; open-circuit resistances; resistive networks; Acoustical engineering; Admittance; Cities and towns; Constraint theory; Educational institutions; Electrical resistance measurement; Geometry; Kirchhoff´s Law; Network topology; Symmetric matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0593-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1992.230416
  • Filename
    230416