Abstract :
Gryphics, Inc. is developing a means of incorporating ICs into a very low cost replaceable chip module (RCM). This high density module accepts a wide variety of devices in many applications. Each device is interconnected by a very low inductance multi-mode compliance contact system, which is solderless and demateable. The loaded RCM can be used as a characterization, test, burn-in, and production system use interface, where all ICs or passive components remain unhandled, and in an actual use configuration. No additional test, burn-in or production socketing is required, with any faulty components removed and replaced without need for rework. Thermal management is also incorporated as required. A wide variety of configurations and interface formats are being developed, with applications including MCMs, memory modules, PCMCIA modules, connectors with integrated semiconductors, microprocessor/memory modules, sockets and interfaces, production level connectors, and multidirectional interconnects among others. The RCMs are low profile, high density packaged assemblies that can accept a mixture of typical packaged devices, discrete/passive devices, chip scale/flip chip devices, or bare die in some cases. Costly or low yield semiconductor devices are interconnected in a removable fashion via an organic, ceramic, or flex substrate without the temperatures required for solder flow. Simple removal and replacement of failed devices allows for great flexibility, upgrade options, and a reduction in the significance of known good die, with correlation between test and as-used performance
Keywords :
add-on boards; electric connectors; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; multichip modules; test equipment; MCMs; PCMCIA modules; RCM; bare die; burn-in interface; ceramic substrate; characterization interface; chip scale devices; demateable contacts; device interconnection; discrete/passive devices; faulty component removal; faulty component replacement; flex substrate; flip chip devices; high density module; integrated semiconductor connectors; interface formats; known good die; loaded RCM; low inductance multi-mode compliance contact system; low yield semiconductor devices; memory modules; microprocessor/memory modules; multidirectional interconnects; organic substrate; packaged devices; production level connectors; production system use interface; removable interconnects; replaceable chip module; socketing; sockets; solderless contacts; test interface; thermal management; Chip scale packaging; Connectors; Costs; Inductance; Microprocessors; Production systems; Semiconductor device packaging; Sockets; System testing; Thermal management;