• DocumentCode
    2857170
  • Title

    Interconnect delay and slew metrics using the first three moments

  • Author

    Sun, Jiaxing ; Zheng, Yun ; Ye, Qing ; Ye, Tianchun

  • Author_Institution
    Inst. of Microelectron., Acad. Sinica, Beijing, China
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    598
  • Lastpage
    602
  • Abstract
    Efficient and highly accurate interconnect delay and slew computation is critical for physical synthesis and static timing analysis. Elmore delay is a simple and closed-form metric, but it has too low an accuracy. Some higher order moments metrics such as AWE can have high accuracy, but we cannot afford their calculation speeds. In this paper we propose two closed-form delay metrics and two closed-from slew metrics using the first three moments, which can be used for both step input and ramp input.
  • Keywords
    delays; integrated circuit design; integrated circuit interconnections; timing; Elmore delay; closed-form delay metrics; first three moments; interconnect delay; physical synthesis; ramp input; slew metrics; static timing analysis; step input; Delay; Integrated circuit interconnections; Linear circuits; Microelectronics; Nonlinear equations; Physics computing; Probability distribution; Routing; Sun; Timing; D3M; ID3M; SIS3M; SS3M;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.67
  • Filename
    1410650