Title :
Interconnect delay and slew metrics using the first three moments
Author :
Sun, Jiaxing ; Zheng, Yun ; Ye, Qing ; Ye, Tianchun
Author_Institution :
Inst. of Microelectron., Acad. Sinica, Beijing, China
Abstract :
Efficient and highly accurate interconnect delay and slew computation is critical for physical synthesis and static timing analysis. Elmore delay is a simple and closed-form metric, but it has too low an accuracy. Some higher order moments metrics such as AWE can have high accuracy, but we cannot afford their calculation speeds. In this paper we propose two closed-form delay metrics and two closed-from slew metrics using the first three moments, which can be used for both step input and ramp input.
Keywords :
delays; integrated circuit design; integrated circuit interconnections; timing; Elmore delay; closed-form delay metrics; first three moments; interconnect delay; physical synthesis; ramp input; slew metrics; static timing analysis; step input; Delay; Integrated circuit interconnections; Linear circuits; Microelectronics; Nonlinear equations; Physics computing; Probability distribution; Routing; Sun; Timing; D3M; ID3M; SIS3M; SS3M;
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
DOI :
10.1109/ISQED.2005.67