DocumentCode
2857170
Title
Interconnect delay and slew metrics using the first three moments
Author
Sun, Jiaxing ; Zheng, Yun ; Ye, Qing ; Ye, Tianchun
Author_Institution
Inst. of Microelectron., Acad. Sinica, Beijing, China
fYear
2005
fDate
21-23 March 2005
Firstpage
598
Lastpage
602
Abstract
Efficient and highly accurate interconnect delay and slew computation is critical for physical synthesis and static timing analysis. Elmore delay is a simple and closed-form metric, but it has too low an accuracy. Some higher order moments metrics such as AWE can have high accuracy, but we cannot afford their calculation speeds. In this paper we propose two closed-form delay metrics and two closed-from slew metrics using the first three moments, which can be used for both step input and ramp input.
Keywords
delays; integrated circuit design; integrated circuit interconnections; timing; Elmore delay; closed-form delay metrics; first three moments; interconnect delay; physical synthesis; ramp input; slew metrics; static timing analysis; step input; Delay; Integrated circuit interconnections; Linear circuits; Microelectronics; Nonlinear equations; Physics computing; Probability distribution; Routing; Sun; Timing; D3M; ID3M; SIS3M; SS3M;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN
0-7695-2301-3
Type
conf
DOI
10.1109/ISQED.2005.67
Filename
1410650
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