Title :
Evaluating Alpha-induced soft errors in embedded microprocessors
Author :
Rech, P. ; Gerardin, S. ; Paccagnella, A. ; Bernardi, P. ; Grosso, M. ; Reorda, M. Sonza ; Appello, D.
Author_Institution :
Dipt. di Ing. dell´´Inf., Univ. di Padova, Padova, Italy
Abstract :
This paper presents the results of alpha single event upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for different codes implemented as test benchmarks. Test results are then discussed to find the contribution of each available resource to the overall device error rate.
Keywords :
benchmark testing; codes; embedded systems; error analysis; microprocessor chips; system-on-chip; alpha single event upsets tests; alpha-induced soft errors; code RAM; codes; device error rate; embedded 8051 microprocessor; internal registers; memory resources; test benchmarks; user memory; Circuit testing; Electronic packaging thermal management; Error analysis; Microprocessors; Random access memory; Registers; Semiconductor device measurement; Single event upset; System testing; System-on-a-chip;
Conference_Titel :
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location :
Sesimbra, Lisbon
Print_ISBN :
978-1-4244-4596-7
Electronic_ISBN :
978-1-4244-4595-0
DOI :
10.1109/IOLTS.2009.5195985
