• DocumentCode
    2857281
  • Title

    Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores

  • Author

    Grosso, M. ; Reorda, M. Sonza

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
  • fYear
    2009
  • fDate
    24-26 June 2009
  • Firstpage
    95
  • Lastpage
    100
  • Abstract
    Strategies based on periodic software-based self-test (SBST) represent an effective and cost-efficient solution for the detection of faults in low-cost embedded systems that do not require immediate recognition of error conditions. Today´s integrated systems increasingly often include hardwired microprocessor devices and field-programmable gate array (FPGA) cores. We propose to implement a test-support module in the on-chip FPGA to observe critical processor signals and hence increase the observation capabilities in non-concurrent software-based on-line test strategies. Preliminary results are shown on a case study based on the Leon3 processor.
  • Keywords
    electron device testing; fault location; field programmable gate arrays; microprocessor chips; system-on-chip; Leon3 processor; SBST; embedded FPGA; fault detection; field-programmable gate array; microprocessor cores; on-line software-based testing; test-support module; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Field programmable gate arrays; Microprocessors; Signal processing; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
  • Conference_Location
    Sesimbra, Lisbon
  • Print_ISBN
    978-1-4244-4596-7
  • Electronic_ISBN
    978-1-4244-4595-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2009.5195989
  • Filename
    5195989