Title : 
Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores
         
        
            Author : 
Grosso, M. ; Reorda, M. Sonza
         
        
            Author_Institution : 
Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
         
        
        
        
        
        
            Abstract : 
Strategies based on periodic software-based self-test (SBST) represent an effective and cost-efficient solution for the detection of faults in low-cost embedded systems that do not require immediate recognition of error conditions. Today´s integrated systems increasingly often include hardwired microprocessor devices and field-programmable gate array (FPGA) cores. We propose to implement a test-support module in the on-chip FPGA to observe critical processor signals and hence increase the observation capabilities in non-concurrent software-based on-line test strategies. Preliminary results are shown on a case study based on the Leon3 processor.
         
        
            Keywords : 
electron device testing; fault location; field programmable gate arrays; microprocessor chips; system-on-chip; Leon3 processor; SBST; embedded FPGA; fault detection; field-programmable gate array; microprocessor cores; on-line software-based testing; test-support module; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Field programmable gate arrays; Microprocessors; Signal processing; Software testing; System testing;
         
        
        
        
            Conference_Titel : 
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
         
        
            Conference_Location : 
Sesimbra, Lisbon
         
        
            Print_ISBN : 
978-1-4244-4596-7
         
        
            Electronic_ISBN : 
978-1-4244-4595-0
         
        
        
            DOI : 
10.1109/IOLTS.2009.5195989