Title :
Simulating electrical properties of interdigitated electrode designs for impedance-based biosensing applications
Author :
MacKay, Scott ; Hermansen, Peter ; Wishart, David ; Hiebert, Wayne ; Jie Chen
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Alberta, Edmonton, AB, Canada
Abstract :
In this paper, we describe a point-of-care biosensor design. The uniqueness of our design is in its capability for detecting a wide variety of target biomolecules and the simplicity of nanoparticle enhanced electrical detection. The electrical properties of interdigitated electrodes and the mechanism for gold nanoparticle-enhanced impedance-based biosensor systems based on these electrodes were simulated using COMSOL Multiphysics software. Understanding these properties and how they can be affected by the design of the sensor, environment during detection, and target biomolecules is vital in designing effective biosensor devices. Simulations were used to show electrical screening for interdigitated electrodes in a salt solution as well as the electric field between individual digits of electrodes. Using these simulations, it was observed that gold nanoparticles bound closely to interdigitated electrodes can lower the electric field magnitude between the digits of the electrode.
Keywords :
bioelectric phenomena; biomedical electrodes; biosensors; electric impedance measurement; electrochemical sensors; gold; nanomedicine; nanoparticles; nanosensors; patient diagnosis; Au; COMSOL Multiphysics software; electric field magnitude; electrical properties; electrical screening; electrode digits; gold nanoparticle-enhanced impedance-based biosensor systems; interdigitated electrode designs; nanoparticle enhanced electrical detection; point-of-care biosensor design; salt solution; target biomolecules; Biological system modeling; Biosensors; Electric fields; Electric variables measurement; Electrodes; Gold; Nanoparticles; Biosensor; COMSOL; Gold Nanoparticles; Interdigitated electrodes;
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
Conference_Location :
Halifax, NS
Print_ISBN :
978-1-4799-5827-6
DOI :
10.1109/CCECE.2015.7129305