DocumentCode :
2857445
Title :
Optimized Gate Drivers for Internally Commutated Thyristors (ICTs)
Author :
Köllensperger, Peter ; De Doncker, Rik W.
Author_Institution :
Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ.
Volume :
5
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
2269
Lastpage :
2275
Abstract :
Today, gate commutated thyristors (GCTs) are commonly used for high-power voltage source inverters, due to their superior electrical performance compared to GTOs and HV-IGBTs. However, the gate drive of GCTs is more complex than an IGBT driver and has to be attached closely to the GCT, which implies several constructional disadvantages. The internally commutated thyristor (ICT), a GCT with integrated turn-off unit, enables the use of a simplified and more reliable gate drive, maintaining the electrical advantages of the GCT. In this paper, the ICT concept is discussed in relation to standard GCTs. Additionally, an optimized gate drive for the ICT is presented. Close attention is paid to improved reliability and easy adaption to different ICT current ratings
Keywords :
driver circuits; integrated circuit reliability; thyristors; gate commutated thyristors; internally commutated thyristors; optimized gate drivers; Anodes; Capacitors; Cathodes; Driver circuits; Impedance; Insulated gate bipolar transistors; MOSFETs; Temperature; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256858
Filename :
4025547
Link To Document :
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