DocumentCode :
2857454
Title :
Effect of seemingly unrelated regression-based modeling approach on solution quality for correlated multiple response optimization problems
Author :
Bera, Sasadhar ; Barman, Goutam ; Mukherjee, Indrajit
Author_Institution :
Shailesh J. Mehta Sch. of Manage., Indian Inst. of Technol., Bombay, Mumbai, India
fYear :
2011
fDate :
6-9 Dec. 2011
Firstpage :
1490
Lastpage :
1494
Abstract :
Multiple response optimization remains a critical and important research area in quality engineering and management. Various methodologies have been proposed to resolve a correlated multiple responses optimization problem. However, very few address the importance of empirical response surface modeling and its influence on the optimal solution quality. In this paper, two different approaches of empirical modeling, using multiple regression, viz. ordinary least square (OLS), and seemingly unrelated regression (SUR) are selected for study. To compare the approaches, two different metaheuristic optimization strategies are used, viz. ant colony optimization in real space (ACOR) and Honey Bee Optimization algorithm (HBO) for a given case situation. Two different cases illustrate that SUR-based response surface models provide significantly better solution than OLS approach for correlated multiple response problems.
Keywords :
least squares approximations; optimisation; quality management; regression analysis; ant colony optimization; empirical response surface modeling; honey bee optimization algorithm; metaheuristic optimization; multiple response optimization; ordinary least square; quality engineering; regression-based modeling; solution quality; Ant colony optimization; Correlation; Data models; Input variables; Mathematical model; Optimization; Response surface methodology; Ant Colony Optimization; Honey Bee Optimization; Multiple Response Optimization; Ordinary Least Square; Seemingly Unrelated Regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
Conference_Location :
Singapore
ISSN :
2157-3611
Print_ISBN :
978-1-4577-0740-7
Electronic_ISBN :
2157-3611
Type :
conf
DOI :
10.1109/IEEM.2011.6118165
Filename :
6118165
Link To Document :
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