Investigation of surface plasmon resonance in Au nanoparticles deposited on ZnO:Al thin films

Author

Pau, J.L. ; Abad, J.M. ; Hernández, M.J. ; Cervera, M. ; Ruiz, E. ; Nunez, C. ; Lorenzo, E. ; Piqueras, J.

Author_Institution

Dipt. de Fis. Aplic., Univ. Autonoma de Madrid, Madrid, Spain

fYear

2011

fDate

8-11 Feb. 2011

Firstpage

1

Lastpage

4

Abstract

Spectroscopic ellipsometry in external reflection (ER) and total internal reflection (TIR) modes is used to characterize surface plasmon resonance in Au nanoparticles (AuNPs) deposited on Al-doped ZnO films via surface thiolation. ER ellipsometry exhibits high sensitivity to the alkanethiol layer as well as to localized surface plasmons at energies around 2.3 eV. TIR ellipsometry reveals resonances at higher energies (2.9-3.35 eV), which are dependent on the environment used: air or deionized water. Coupling between charge dipoles inside the AZO layer and surface plasmons may account for the existence of those resonances.

Keywords

II-VI semiconductors; aluminium; ellipsometry; gold; nanofabrication; nanoparticles; semiconductor thin films; surface plasmon resonance; wide band gap semiconductors; zinc compounds; Au; ZnO:Al; alkanethiol layer; charge dipole; deionized water; electron volt energy 2.9 eV to 3.35 eV; ellipsometry; external reflection; nanoparticles; surface plasmon resonance; surface thiolation; thin films; total internal reflection; Ellipsometry; Erbium; Glass; Gold; Plasmons; Surface treatment; Zinc oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices (CDE), 2011 Spanish Conference on

Conference_Location

Palma de Mallorca

Print_ISBN

978-1-4244-7863-7

Type

conf

DOI

10.1109/SCED.2011.5744180

Filename

5744180