• DocumentCode
    2857475
  • Title

    Power MOSFETs Paralleling Operation for High Power High Density Converters

  • Author

    Wang, Hongfang ; Wang, Fred

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
  • Volume
    5
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    2284
  • Lastpage
    2289
  • Abstract
    In high power high density converters, the power MOSFETs can be used in parallel as the main switch to meet the current rating requirement, increase the switching frequency, and reduce the power loss. This paper investigates the possible benefits and problems associated with the power MOSFETs paralleling operation for higher power high frequency applications. The conduction state current sharing and power loss are investigated considering the device junction temperature effect and conduction resistance mismatch. The switching transient current sharing is analyzed including the device parameters tolerance, power stage parasitic inductance and gate driving ability. A dynamic current sharing approach from the gate side is proposed. The experimental results indicate that the power MOSFETs can be paralleled with the proper gate driving design even if the device parameters are mismatched, and as a result the switching losses are significantly reduced
  • Keywords
    high-voltage engineering; power MOSFET; power convertors; MOSFET parallel operation; conduction resistance mismatch; conduction state current sharing; device junction temperature effect; device parameter tolerance; dynamic current sharing approach; gate driving ability; high power high density converters; power MOSFET; power loss; power stage parasitic inductance; switching transient current sharing; Frequency conversion; MOSFETs; Resonance; Switches; Switching converters; Switching frequency; Switching loss; Temperature; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256860
  • Filename
    4025549