Title :
Charge transfer in buried-channel charge-coupled devices
Author :
Daimon, Y. ; Mohsen, A. ; McGill, Tanya
Author_Institution :
California Institute of Technology, Pasadena, CA, USA
Abstract :
A detailed numerical simulation of the charge-transfer process in buried-channel CCDs will be presented. The limitations on the device performance due to incomplete free charge transfer, device parameters and clocking waveforms will be discussed.
Keywords :
Charge coupled devices; Charge transfer; Coupling circuits; Electrodes; Electrons; Integrated circuit technology; Partial differential equations; Poisson equations; Shift registers; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155317
