• DocumentCode
    2857501
  • Title

    Charge transfer in buried-channel charge-coupled devices

  • Author

    Daimon, Y. ; Mohsen, A. ; McGill, Tanya

  • Author_Institution
    California Institute of Technology, Pasadena, CA, USA
  • Volume
    XVII
  • fYear
    1974
  • fDate
    15-13 Feb. 1974
  • Firstpage
    146
  • Lastpage
    147
  • Abstract
    A detailed numerical simulation of the charge-transfer process in buried-channel CCDs will be presented. The limitations on the device performance due to incomplete free charge transfer, device parameters and clocking waveforms will be discussed.
  • Keywords
    Charge coupled devices; Charge transfer; Coupling circuits; Electrodes; Electrons; Integrated circuit technology; Partial differential equations; Poisson equations; Shift registers; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1974.1155317
  • Filename
    1155317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2857501