Title :
A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations
Author :
Hubert, Guillaume ; Velazco, Raoul ; Peronnard, Paul
Author_Institution :
ONERA-CERT, France
Abstract :
The goal of this work is to confront SER predictions done with MUSCA SEP3 to measures performed at high altitude (in commercial planes) by means a generic and flexible experimental testboard developed by TIMA. In this case the testboard was a memory architecture of 1 Gigabit made from SRAMs issued from two successive generations, 130 nm and 90 nm, respectively named models 1 and 2 in the following.
Keywords :
SRAM chips; integrated circuit testing; MUSCA SEP3 calculations; SRAM; TIMA; advanced integrated circuit; generic platform; high altitude SEU experiments; memory architecture; remote accelerated tests; size 130 nm; size 90 nm; storage capacity 1 Gbit; Circuit testing; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Life estimation; Metallization; Neutrons; Passivation; Predictive models; Single event upset;
Conference_Titel :
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location :
Sesimbra, Lisbon
Print_ISBN :
978-1-4244-4596-7
Electronic_ISBN :
978-1-4244-4595-0
DOI :
10.1109/IOLTS.2009.5196005
