Title :
Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs
Author :
Fidalgo, André V. ; Alves, Gustavo R. ; Felgueiras, Manuel C. ; Gericota, Manuel G.
Author_Institution :
LABORIS, ISEP, Portugal
Abstract :
This paper proposes an online mechanism that can evaluate the sensitivity of single event upsets (SEUs) of field programmable gate arrays (FPGAs). The online detection mechanism cyclically reads and compares the values form the external and internal configuration memories, taking into account the mask information. This remote detection method also signals any mismatch as a result of a SEU that affects both used and not-used FPGA parts, which maximizes the monitored area. By utilizing an external, Web-accessible controller that is connected to the test infrastructure, the possibility of running the same operation in a remote manner is enabled. Moreover, the need for a local memory to store the mask values is also eliminated.
Keywords :
Internet; SRAM chips; field programmable gate arrays; SRAM-based FPGA; Web-accessible controller; external configuration memories; field programmable gate arrays; internal configuration memories; mask information; online detection; online evaluation; sensitivity evaluation; single event upsets; test infrastructures; Circuit faults; Degradation; Field programmable gate arrays; Flip-flops; Manufacturing; Routing; Single event transient; Single event upset; Table lookup; Testing;
Conference_Titel :
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location :
Sesimbra, Lisbon
Print_ISBN :
978-1-4244-4596-7
Electronic_ISBN :
978-1-4244-4595-0
DOI :
10.1109/IOLTS.2009.5196006
