Title :
Multi-Frequency Microwave Response to Periodic Rougheness
Author :
Kuria, David ; Lu, Hui ; Koike, Toshio ; Tsutsui, Hiroyuki ; Graf, Tobias
Author_Institution :
Dept. of Civil Eng., Univ. of Tokyo, Tokyo
fDate :
July 31 2006-Aug. 4 2006
Abstract :
A series of field experiments were conducted to verify the effects of roughness on passive microwave emission. From these field experiments, it was observed that surface roughness increases observed brightness temperatures (higher emissivity) at horizontal polarization while diminishing the vertically polarized brightness temperatures marginally. The advanced integral equation method (AIEM) and QP models were found to model the effects of surface roughness fairly reasonably. The QP model which is a parameterized version of the AIEM was found to show correspondence with the AIEM simulations and is therefore recommended for application in AMSR based data assimilation schemes.
Keywords :
data assimilation; geophysical techniques; surface roughness; QP model; advanced integral equation method; brightness temperature; data assimilation; multifrequency microwave response; passive microwave emission; surface roughness; Brightness temperature; Data assimilation; Frequency; Land surface; Quadratic programming; Rough surfaces; Scattering; Soil moisture; Surface roughness; Surface waves;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2006. IGARSS 2006. IEEE International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-9510-7
DOI :
10.1109/IGARSS.2006.451