DocumentCode
2857644
Title
Accelerated life testing leds on temperature and current
Author
Nogueira, Eduardo ; Mateos, Juan
Author_Institution
Dept. de Electron. Fis., Univ. Politec., Madrid, Spain
fYear
2011
fDate
8-11 Feb. 2011
Firstpage
1
Lastpage
4
Abstract
LED products intended for outdoor applications need specific tests to evaluate its reliability. In this paper tests for detecting failures at high temperatures and currents below maximum current rating conditions, have been carried out. Open circuit catastrophic failures have been observed in these tests at a constant current. Failure mechanisms have been analyzed. Temperature and current acceleration factors of this failure mechanism have been evaluated based on Arrhenius and Inverse Power Law Relationship.
Keywords
failure analysis; life testing; light emitting diodes; Arrhenius-inverse power law model; LED; accelerated life testing; current acceleration factors; light-emitting diodes; open circuit catastrophic failures; temperatures acceleration factors; Degradation; Encapsulation; Light emitting diodes; Mathematical model; Reliability; Resistance; Temperature measurement; Accelerated Life Testing; Arrhenius-Inverse Power Law model; Light-emitting diodes; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices (CDE), 2011 Spanish Conference on
Conference_Location
Palma de Mallorca
Print_ISBN
978-1-4244-7863-7
Type
conf
DOI
10.1109/SCED.2011.5744191
Filename
5744191
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