Title :
Operational characteristics of CID imager
Author :
Michon, G. ; Burke, H.
Author_Institution :
General Electric Corp. Research-Development, Schenectady, NY, USA
Abstract :
A 10,000-element imager has been evaluated for spectral sensitivity dynamic range, noise, dark current, MTF, blooming and operating speed. Operating techniques resulting in significantly improved performance will be described.
Keywords :
Capacitance; Charge transfer; Conductors; Dark current; Image storage; MOS capacitors; Semiconductor device noise; Silicon; Substrates; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155333
