• DocumentCode
    2857765
  • Title

    C-testable S-box implementation for secure advanced encryption standard

  • Author

    Rahaman, H. ; Mathew, J. ; Jabir, A. ; Pradhan, D.K.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Bristol, Bristol, UK
  • fYear
    2009
  • fDate
    24-26 June 2009
  • Firstpage
    210
  • Lastpage
    211
  • Abstract
    We propose a C-testable S-box implementation which is one of the most complex blocks in AES hardware implementation. Only 12 constant vectors are sufficient to achieve 100% fault coverage in the S-box. C-testability is achieved with an extra hardware overhead of 8.2 percent.
  • Keywords
    cryptography; integrated circuit testing; integrated logic circuits; logic gates; AES algorithm; C-testable design; EXOR gate; EXOR tree; S-BOX architecture; extra hardware overhead; iterative algorithm; secure advanced encryption standard; substitution table; Circuit faults; Circuit testing; Computer science; Controllability; Cryptography; Design for testability; Galois fields; Hardware; Information security; Iterative algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
  • Conference_Location
    Sesimbra, Lisbon
  • Print_ISBN
    978-1-4244-4596-7
  • Electronic_ISBN
    978-1-4244-4595-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2009.5196017
  • Filename
    5196017