Title :
A low-cost fault-tolerant technique for Carry Look-Ahead adder
Author :
Namazi, Alireza ; Sedaghat, Yasser ; Miremadi, Seyed Ghassem ; Ejlali, Alireza
Author_Institution :
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
Abstract :
This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.
Keywords :
adders; carry logic; circuit testing; fault tolerance; TMR; area overheads; carry look-ahead adder; duplication; low-cost fault-tolerant technique; multiple-bit transient faults; parity prediction; power-delay product; single-bit transient faults; triple modular redundancy; Adders; Arithmetic; Circuit faults; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Redundancy; Very large scale integration; Carry Look-Ahead Adder; Fault Tolerance; Single-Event Transient;
Conference_Titel :
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location :
Sesimbra, Lisbon
Print_ISBN :
978-1-4244-4596-7
Electronic_ISBN :
978-1-4244-4595-0
DOI :
10.1109/IOLTS.2009.5196019
