• DocumentCode
    2857831
  • Title

    Invited: Physical limits in digital electronics

  • Author

    Keyes, R.

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
  • Volume
    XVII
  • fYear
    1974
  • fDate
    15-13 Feb. 1974
  • Firstpage
    106
  • Lastpage
    107
  • Abstract
    Miniaturization has been found to be the avenue to progress in digital electronics. Dielectric breakdown, thermal resistance and random fluctuations of impurity numbers can be identified as effects that will limit progress toward smaller dimensions.
  • Keywords
    Costs; Heat transfer; Impedance; Information processing; Logic circuits; Manufacturing; Power dissipation; Solid state circuits; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1974.1155339
  • Filename
    1155339
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2857831