Title :
Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
Author :
López-Calle, I. ; Franco, F.J. ; Agapito, J.A. ; Izquierdo, J.G.
Author_Institution :
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid, Madrid, Spain
Abstract :
One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.
Keywords :
analogue circuits; circuit reliability; resistors; transients; analog electronic devices; analog electronic systems reliability; energetic ions; load resistor; network loading; single-event transients; spatial missions; spurious transients; worst-case parameter; Operational amplifiers; Resistors; SPICE; Shape; Transient analysis; Transistors; Voltage measurement; Analog devices; bipolar technology; laser tests; single event transients; system reliability; two-photon absorption;
Conference_Titel :
Electron Devices (CDE), 2011 Spanish Conference on
Conference_Location :
Palma de Mallorca
Print_ISBN :
978-1-4244-7863-7
DOI :
10.1109/SCED.2011.5744202
