Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices

Author

López-Calle, I. ; Franco, F.J. ; Agapito, J.A. ; Izquierdo, J.G.

Author_Institution

Dept. de Fis. Aplic. III, Univ. Complutense de Madrid, Madrid, Spain

fYear

2011

fDate

8-11 Feb. 2011

Firstpage

1

Lastpage

4

Abstract

One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.

Keywords

analogue circuits; circuit reliability; resistors; transients; analog electronic devices; analog electronic systems reliability; energetic ions; load resistor; network loading; single-event transients; spatial missions; spurious transients; worst-case parameter; Operational amplifiers; Resistors; SPICE; Shape; Transient analysis; Transistors; Voltage measurement; Analog devices; bipolar technology; laser tests; single event transients; system reliability; two-photon absorption;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices (CDE), 2011 Spanish Conference on

Conference_Location

Palma de Mallorca

Print_ISBN

978-1-4244-7863-7

Type

conf

DOI

10.1109/SCED.2011.5744202

Filename

5744202