Title :
Investigation of the Near Field Coupling Effects on Common-Mode EMI in Power Converter
Author :
Chen, Wei ; Feng, Limin ; Chen, Henglin ; Qian, Zhaoming
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou
Abstract :
In this paper, the effects of near field couplings on common mode noise that exist in boost PFC converter are modeled and analyzed. It is obvious that these couplings have some effects on CM noise. For electric coupling, effects of parasitic capacitances between PCB traces and heat sink on CM noise is limited since these capacitances is so small compared with the parasitic capacitance between switching device and heat sink. For magnetic couplings, the mutual inductance between Boost inductor and CM noise current loop has no effect on CM noise, and mutual inductance between DM noise loop and CM noise loop will influence the resonant frequency
Keywords :
electromagnetic interference; heat sinks; inductors; power convertors; power factor correction; printed circuits; CM noise current loop; CM noise loop; DM noise loop; PCB; boost PFC converter; boost inductor; common mode noise; common-mode EMI; electric coupling; heat sink; magnetic couplings; mutual inductance; near field coupling effects investigation; parasitic capacitances effects; power converter; resonant frequency; switching device; Electromagnetic interference; Heat sinks; Inductance; Inductors; Magnetic analysis; Magnetic noise; Magnetic resonance; Mutual coupling; Parasitic capacitance; Resistance heating;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256903
