DocumentCode
2858679
Title
COMPACT: a hybrid method for compressing test data
Author
Ishida, Masahiro ; Ha, Dong Sam ; Yamaguchi, Takahiro
Author_Institution
Advantest Lab. Ltd., Miyagi, Japan
fYear
1998
fDate
26-30 Apr 1998
Firstpage
62
Lastpage
69
Abstract
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data. Our previous method was based on the Burrows-Wheeler transformation on the sequence of test patterns and run-length coding. In this paper, we present a new method, called COMPACT, which further improves our previous method. The key idea of COMPACT is to employ two data compression schemes, run-length coding for data with low activity and GZIP for data with high activity. COMPACT increases the compression ratio of test data, on average, by 1.9 times compared with our previous method
Keywords
application specific integrated circuits; automatic testing; data compression; integrated circuit testing; runlength codes; Burrows-Wheeler transformation; COMPACT; GZIP; automatic test equipment; download time; hybrid method; overall throughput; run-length coding; test data compression; test patterns; Arithmetic; Automatic test equipment; Automatic testing; Data compression; Dictionaries; Laboratories; Test data compression; Test pattern generators; Throughput; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-8436-4
Type
conf
DOI
10.1109/VTEST.1998.670850
Filename
670850
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