DocumentCode
2858708
Title
Development of Virtual Impulse Laboratory
Author
Agrawal, Prashant Kr ; Chandan ; Kishore, N.K.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., Kharagpur
fYear
2006
fDate
24-26 May 2006
Firstpage
1
Lastpage
6
Abstract
Natural phenomena such as lightning result in transient overvoltages and overcurrents thus interrupting the power supply. To avoid this, an analysis of impulse voltages and currents is a must. Apart from existing high voltage laboratories, a need was felt to develop a virtual laboratory which being user-interactive has facilities for generating virtual impulse voltages and currents. Hence an interactive Web based laboratory is introduced now to determine the impulse generator settings in order to virtually realize standard impulse voltages and currents. This solution also aims to develop software that enables the user to pre-select the values of circuit elements that is required to generate impulse voltages and currents for test purposes. These impulses have to meet a voltage-time-curve with certain tolerances according to IEC 60060-1. This application makes the software useful for impulse testing of power apparatus. The input is fed by the user using the Web based interface. These values sent by the client machine are then received by the server. The server processes the input data using the software which runs using programs in Java and PHP. If need arises to access the available database, developed using MSSQL, the database is accessed. The output data is then sent to the client machine and is displayed in Java applet on the user´s browser
Keywords
Internet; client-server systems; laboratories; power apparatus; power engineering computing; pulse generators; virtual reality; IEC 60060-1; Java applet; Java programs; Web based interface; client machine; impulse generator settings; interactive Web based laboratory; power apparatus impulse testing; power supply interruption; transient overcurrents; transient overvoltages; virtual impulse laboratory; voltage-time-curve; Circuit testing; Databases; Impulse testing; Java; Laboratories; Lightning; Power supplies; Software testing; Surges; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2006 1ST IEEE Conference on
Conference_Location
Singapore
Print_ISBN
0-7803-9513-1
Electronic_ISBN
0-7803-9514-X
Type
conf
DOI
10.1109/ICIEA.2006.257096
Filename
4025714
Link To Document