Title :
LSI test strategies: Present and future
Author_Institution :
Bell Labs., Murray Hill, NJ, USA
Abstract :
If you can´t measure it, you don´t know it. If you don´t know it, economic catastrophy usually strikes. Testability must be planned at the LSI concept, designed in, and with an implemented economical concern to insure an LSI payoff. These vital issues will be appraised.
Keywords :
Circuit testing; Costs; Large scale integration; Logic devices; Logic testing; Microprocessors; Pins; Sequential analysis; System testing; Test equipment;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
DOI :
10.1109/ISSCC.1975.1155424
