Title :
Enhancing test effectiveness for analog circuits using synthesized measurements
Author :
Variyam, Pramodchandran N. ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The use of alternate tests in addition to specification-based measurements is achieving more recognition in industry due to the higher coverage that they provide. The fault and yield coverages of these tests depend on how the pass/fail test decision is made. In this paper we address the critical issue of accurate test threshold determination for these alternate tests. We propose to post-process the given set of sensitive and linearly independent measurements to synthesize a new set of measurements based on which the pass/fail decision is made. A novel methodology for post processing the measurement results called measurement synthesis is presented. Simulation results show that test effectiveness can be greatly enhanced by measurement synthesis
Keywords :
VLSI; analogue integrated circuits; automatic testing; integrated circuit testing; accurate test threshold determination; alternate tests; analog circuit testing; measurement synthesis; pass/fail test decision; post processing methodology; synthesized measurements; test effectiveness enhancement; Analog circuits; CMOS process; Circuit faults; Circuit optimization; Circuit synthesis; Circuit testing; Electric variables measurement; Frequency domain analysis; Impulse testing; Pulse circuits;
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-8436-4
DOI :
10.1109/VTEST.1998.670860
