Title :
Session 8 computer aids for IC design and testing [breaker page]
Author_Institution :
IBM Res. Ctr., Yorktown Heights, NY
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Computer aids for IC design and testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1975.1155453
