Title :
Overload instabilities in microwave transistor amplifiers
Author :
Wilson, Keith ; Hughes, E. ; Walker, Julian
Author_Institution :
General Electric Co., Ltd., Middelsex, England
Abstract :
Overload instabilities resulting from parametric action in the emitter junction capacitance, analyzed in terms of the junction gamma, fcproduct, will be reported. Successful means of suppressing the instabilities will be described.
Keywords :
Capacitance; Electrical resistance measurement; Frequency measurement; Microwave amplifiers; Microwave devices; Microwave transistors; Radar applications; Radar equipment; Signal generators; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1976.1155478