DocumentCode
2860017
Title
A Low-cost Automated Measurement System for Quality Control of AMLCD Manufacturing
Author
Cheng, L.W. ; Ruan, S.J.
Author_Institution
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei
fYear
2006
fDate
24-26 May 2006
Firstpage
1
Lastpage
4
Abstract
In this paper, an automated measurement system which inspects performance of AMLCD for manufacturing process is described. Without using an additional optical bench or stages, the system provides operators with a low-cost tool to test AMLCD for quality control. In addition, we demonstrated this system for testing some performance of LCD monitors
Keywords
computer displays; liquid crystal displays; matrix algebra; quality control; active-matrix liquid crystal display; low-cost automated measurement system; manufacturing process; quality control; Active matrix liquid crystal displays; Computer displays; Computer graphics; Manufacturing automation; Production; Quality control; Software measurement; Stability; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2006 1ST IEEE Conference on
Conference_Location
Singapore
Print_ISBN
0-7803-9513-1
Electronic_ISBN
0-7803-9514-X
Type
conf
DOI
10.1109/ICIEA.2006.257180
Filename
4025798
Link To Document