Title :
A Low-cost Automated Measurement System for Quality Control of AMLCD Manufacturing
Author :
Cheng, L.W. ; Ruan, S.J.
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei
Abstract :
In this paper, an automated measurement system which inspects performance of AMLCD for manufacturing process is described. Without using an additional optical bench or stages, the system provides operators with a low-cost tool to test AMLCD for quality control. In addition, we demonstrated this system for testing some performance of LCD monitors
Keywords :
computer displays; liquid crystal displays; matrix algebra; quality control; active-matrix liquid crystal display; low-cost automated measurement system; manufacturing process; quality control; Active matrix liquid crystal displays; Computer displays; Computer graphics; Manufacturing automation; Production; Quality control; Software measurement; Stability; System testing; Time measurement;
Conference_Titel :
Industrial Electronics and Applications, 2006 1ST IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
0-7803-9513-1
Electronic_ISBN :
0-7803-9514-X
DOI :
10.1109/ICIEA.2006.257180
