DocumentCode
2860421
Title
Author index
fYear
1998
fDate
30-30 April 1998
Firstpage
471
Lastpage
472
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location
Monterey, CA, USA
ISSN
1093-0167
Print_ISBN
0-8186-8436-4
Type
conf
DOI
10.1109/VTEST.1998.670914
Filename
670914
Link To Document